Sami Beydeda, Volker Gruhn. Integrating White- and Black-Box Techniques for Class-Level Regression Testing. In 25th International Computer Software and Applications Conference (COMPSAC 2001), Invigorating Software Development, 8-12 October 2001, Chicago, IL, USA. pages 357-362, IEEE Computer Society, 2001. [doi]
Abstract is missing.