A Tool for Analog/RF BIST Evaluation Using Statistical Models of Circuit Parameters

Kamel Beznia, Ahcène Bounceur, Reinhardt Euler, Salvador Mir. A Tool for Analog/RF BIST Evaluation Using Statistical Models of Circuit Parameters. ACM Trans. Design Autom. Electr. Syst., 20(2):31, 2015. [doi]

@article{BezniaBEM15,
  title = {A Tool for Analog/RF BIST Evaluation Using Statistical Models of Circuit Parameters},
  author = {Kamel Beznia and Ahcène Bounceur and Reinhardt Euler and Salvador Mir},
  year = {2015},
  doi = {10.1145/2699837},
  url = {http://doi.acm.org/10.1145/2699837},
  researchr = {https://researchr.org/publication/BezniaBEM15},
  cites = {0},
  citedby = {0},
  journal = {ACM Trans. Design Autom. Electr. Syst.},
  volume = {20},
  number = {2},
  pages = {31},
}