Scalable techniques and tools for reliability analysis of large circuits - researchr publication authors

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Debayan Bhaduri, Sandeep K. Shukla, Paul Graham, Maya Gokhale. Scalable techniques and tools for reliability analysis of large circuits. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 705-710, IEEE Computer Society, 2007. [doi]

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