Rishabh Bhandia, Jose J. Chavez, Milos Cvetkovic, Peter Palensky. High Impedance Fault Detection in Real-Time and Evaluation Using Hardware-In-Loop Testing. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 182-187, IEEE, 2018. [doi]
Abstract is missing.