Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits - researchr publication authors

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Sarvesh Bhardwaj, Sarma B. K. Vrudhula, Praveen Ghanta, Yu Cao. Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits. In Ellen Sentovich, editor, Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006. pages 791-796, ACM, 2006. [doi]

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