Sarvesh Bhardwaj, Sarma B. K. Vrudhula, Praveen Ghanta, Yu Cao. Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits. In Ellen Sentovich, editor, Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006. pages 791-796, ACM, 2006. [doi]
@inproceedings{BhardwajVGC06,
title = {Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits},
author = {Sarvesh Bhardwaj and Sarma B. K. Vrudhula and Praveen Ghanta and Yu Cao},
year = {2006},
doi = {10.1145/1146909.1147109},
url = {http://doi.acm.org/10.1145/1146909.1147109},
tags = {optimization, modeling, analysis, process modeling},
researchr = {https://researchr.org/publication/BhardwajVGC06},
cites = {0},
citedby = {0},
pages = {791-796},
booktitle = {Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006},
editor = {Ellen Sentovich},
publisher = {ACM},
isbn = {1-59593-381-6},
}