Harsh Bhargav, Vineesh V. S., Binod Kumar 0001, Virendra Singh. Enhancing Testbench Quality via Genetic Algorithm. In 64th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2021, Lansing, MI, USA, August 9-11, 2021. pages 652-656, IEEE, 2021. [doi]
Abstract is missing.