A Universal Random Test Generator for Functional Verification of Microprocessors and System-on-Chip - researchr publication

researchr

You are not signed in
Sign in
Sign up

K. Uday Bhaskar, M. Prasanth, G. Chandramouli, V. Kamakoti. A Universal Random Test Generator for Functional Verification of Microprocessors and System-on-Chip. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 207-212, IEEE Computer Society, 2005. [doi]

Abstract is missing.

runs on WebDSL