Voltage Profile Improvement Using FACTS Devices: A Comparison between SVC, TCSC and TCPST

M. Arun Bhaskar, C. Subramani, M. Jagadeesh Kumar, Subranshu Sekhar Dash. Voltage Profile Improvement Using FACTS Devices: A Comparison between SVC, TCSC and TCPST. In ARTCom 2009, International Conference on Advances in Recent Technologies in Communication and Computing, Kottayam, Kerala, India, 27-28 October 2009. pages 890-892, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.