Mayukh Bhattacharya, Beatrice Solignac, Michael Dürr. Application of Sampling in Industrial Analog Defect Simulation. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 436-445, IEEE, 2022. [doi]
@inproceedings{BhattacharyaSD22, title = {Application of Sampling in Industrial Analog Defect Simulation}, author = {Mayukh Bhattacharya and Beatrice Solignac and Michael Dürr}, year = {2022}, doi = {10.1109/ITC50671.2022.00051}, url = {https://doi.org/10.1109/ITC50671.2022.00051}, researchr = {https://researchr.org/publication/BhattacharyaSD22}, cites = {0}, citedby = {0}, pages = {436-445}, booktitle = {IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022}, publisher = {IEEE}, isbn = {978-1-6654-6270-9}, }