Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang. Double-Tree Scan: A Novel Low-Power Scan-Path Architecture. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 470-479, IEEE Computer Society, 2003. [doi]
Abstract is missing.