A Robust Protocol for Concurrent On-Line Test (COLT) of NoC-based Systems-on-a-Chip

Praveen Bhojwani, Rabi N. Mahapatra. A Robust Protocol for Concurrent On-Line Test (COLT) of NoC-based Systems-on-a-Chip. In Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007. pages 670-675, IEEE, 2007. [doi]

@inproceedings{BhojwaniM07,
  title = {A Robust Protocol for Concurrent On-Line Test (COLT) of NoC-based Systems-on-a-Chip},
  author = {Praveen Bhojwani and Rabi N. Mahapatra},
  year = {2007},
  doi = {10.1109/DAC.2007.375249},
  url = {http://doi.ieeecomputersociety.org/10.1109/DAC.2007.375249},
  tags = {rule-based, protocol, testing},
  researchr = {https://researchr.org/publication/BhojwaniM07},
  cites = {0},
  citedby = {0},
  pages = {670-675},
  booktitle = {Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007},
  publisher = {IEEE},
}