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Charka: A reliability-aware test scheme for diagnosis of channel shorts beyond mesh NoCs

Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas. Charka: A reliability-aware test scheme for diagnosis of channel shorts beyond mesh NoCs. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 214-219, IEEE, 2017. [doi]

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Biswajit Bhowmik

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Jatindra Kumar Deka

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Santosh Biswas

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