Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas. Selective Fault-Masking for Improving Yield and Performance of On-Chip Networks. In 2021 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2021, Melbourne, Australia, October 17-20, 2021. pages 3336-3341, IEEE, 2021. [doi]
Abstract is missing.