The following publications are possibly variants of this publication:
- A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and Diagnosing Interconnect Shorts in On-chip NetworksBiswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka. hpcc 2016: 530-537 [doi]
- Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC ChannelsBiswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka. SMC 2020: 2339-2344 [doi]
- Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip NetworksBiswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka, Bhargab B. Bhattacharya. tvlsi, 26(6):1026-1039, 2018. [doi]