Shifat Sahariar Bhuiyan, Nargiz Humbatova, Paolo Tonella. Embedding-based Diversity Mapping for Test Generator Selection and Input Prioritization in Grammar-based Testing. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2026, Daejeon, Republic of Korea, May 18-22, 2026. pages 441-452, IEEE, 2026. [doi]
Abstract is missing.