Swarup Bhunia, Kaushik Roy, Jaume Segura. A novel wavelet transform based transient current analysis for fault detection and localization. In Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002. pages 361-366, ACM, 2002. [doi]
@inproceedings{BhuniaRS02,
title = {A novel wavelet transform based transient current analysis for fault detection and localization},
author = {Swarup Bhunia and Kaushik Roy and Jaume Segura},
year = {2002},
doi = {10.1145/513918.514011},
url = {http://doi.acm.org/10.1145/513918.514011},
tags = {rule-based, analysis},
researchr = {https://researchr.org/publication/BhuniaRS02},
cites = {0},
citedby = {0},
pages = {361-366},
booktitle = {Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002},
publisher = {ACM},
isbn = {1-58113-461-4},
}