Xin Bi, Xiaoping Xu, Jinhua Shen. The Application of Independent Component Analysis Method on the Mura Defect Inspection of LCD Process. In Xianmin Zhang, Honghai Liu, Zhong Chen, Nianfeng Wang, editors, Intelligent Robotics and Applications - 7th International Conference, ICIRA 2014, Guangzhou, China, December 17-20, 2014, Proceedings, Part II. Volume 8918 of Lecture Notes in Computer Science, pages 321-330, Springer, 2014. [doi]
@inproceedings{BiXS14,
title = {The Application of Independent Component Analysis Method on the Mura Defect Inspection of LCD Process},
author = {Xin Bi and Xiaoping Xu and Jinhua Shen},
year = {2014},
doi = {10.1007/978-3-319-13963-0_33},
url = {http://dx.doi.org/10.1007/978-3-319-13963-0_33},
researchr = {https://researchr.org/publication/BiXS14},
cites = {0},
citedby = {0},
pages = {321-330},
booktitle = {Intelligent Robotics and Applications - 7th International Conference, ICIRA 2014, Guangzhou, China, December 17-20, 2014, Proceedings, Part II},
editor = {Xianmin Zhang and Honghai Liu and Zhong Chen and Nianfeng Wang},
volume = {8918},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-319-13962-3},
}