A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method

Xin Bi, Chungang Zhuang, Han Ding. A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method. IEEE Signal Process. Lett., 16(4):311-314, 2009. [doi]

Authors

Xin Bi

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Chungang Zhuang

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Han Ding

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