Xin Bi, Chungang Zhuang, Han Ding. A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method. IEEE Signal Process. Lett., 16(4):311-314, 2009. [doi]
@article{BiZD09,
title = {A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method},
author = {Xin Bi and Chungang Zhuang and Han Ding},
year = {2009},
doi = {10.1109/LSP.2009.2014113},
url = {http://dx.doi.org/10.1109/LSP.2009.2014113},
researchr = {https://researchr.org/publication/BiZD09},
cites = {0},
citedby = {0},
journal = {IEEE Signal Process. Lett.},
volume = {16},
number = {4},
pages = {311-314},
}