Giorgio Biagetti, Paolo Crippa, Alessandro Curzi, Simone Orcioni, Claudio Turchetti. A novel approach to statistical simulation of ICS affected by non-linear variabilities. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 2985-2988, IEEE, 2008. [doi]
Abstract is missing.