Matteo Biagiola, Nicolás Cardozo, Donghwan Shin, Foutse Khomh, Andrea Stocco 0001, Vincenzo Riccio. Summary of the Fourth International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2023). ACM SIGSOFT Software Engineering Notes, 48(4):39-40, October 2023. [doi]
Abstract is missing.