A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes

Stephan Biber, Oleg Cojocari, Günther Rehm, Bastian Mottet, Manuel Rodríguez-Gironés, Lorenz-Peter Schmidt, Hans L. Hartnagel. A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes. IEEE T. Instrumentation and Measurement, 53(2):581-587, 2004. [doi]

Abstract

Abstract is missing.