Software Defect Prediction Using Regression via Classification

Stamatia Bibi, Grigorios Tsoumakas, Ioannis Stamelos, Ioannis P. Vlahavas. Software Defect Prediction Using Regression via Classification. In 2006 IEEE/ACS International Conference on Computer Systems and Applications (AICCSA 2006), March 8-11, Dubai/Sharjah, UAE. pages 330-336, IEEE, 2006. [doi]

@inproceedings{BibiTSV06,
  title = {Software Defect Prediction Using Regression via Classification},
  author = {Stamatia Bibi and Grigorios Tsoumakas and Ioannis Stamelos and Ioannis P. Vlahavas},
  year = {2006},
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=33913&arnumber=1618375&count=182&index=50},
  tags = {classification},
  researchr = {https://researchr.org/publication/BibiTSV06},
  cites = {0},
  citedby = {0},
  pages = {330-336},
  booktitle = {2006 IEEE/ACS International Conference on Computer Systems and Applications (AICCSA 2006), March 8-11, Dubai/Sharjah, UAE},
  publisher = {IEEE},
}