Software Defect Prediction Using Regression via Classification

Stamatia Bibi, Grigorios Tsoumakas, Ioannis Stamelos, Ioannis P. Vlahavas. Software Defect Prediction Using Regression via Classification. In 2006 IEEE/ACS International Conference on Computer Systems and Applications (AICCSA 2006), March 8-11, Dubai/Sharjah, UAE. pages 330-336, IEEE, 2006. [doi]

Abstract

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