Improved Optoelectronic Technique for the Time-Domain Characterization of Sampling Oscilloscopes

Mark Bieler, Meinhard Spitzer, Klaus Pierz, Uwe Siegner. Improved Optoelectronic Technique for the Time-Domain Characterization of Sampling Oscilloscopes. IEEE T. Instrumentation and Measurement, 58(4):1065-1071, 2009. [doi]

Abstract

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