Design Patterns and Change Proneness: An Examination of Five Evolving Systems

James M. Bieman, Greg Straw, Huxia Wang, P. Willard Munger, Roger T. Alexander. Design Patterns and Change Proneness: An Examination of Five Evolving Systems. In 9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia. pages 40-49, IEEE Computer Society, 2003. [doi]

Authors

James M. Bieman

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Greg Straw

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Huxia Wang

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P. Willard Munger

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Roger T. Alexander

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