Design Patterns and Change Proneness: An Examination of Five Evolving Systems

James M. Bieman, Greg Straw, Huxia Wang, P. Willard Munger, Roger T. Alexander. Design Patterns and Change Proneness: An Examination of Five Evolving Systems. In 9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia. pages 40-49, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.