Testing a multichip package for a consumer communications application

Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer. Testing a multichip package for a consumer communications application. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 222-227, IEEE Computer Society, 1998. [doi]

Authors

Alex S. Biewenga

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Math Muris

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Rodger Schuttert

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Urs Fawer

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