Céline Bigot, Alain Faivre, Christophe Gaston, Julien Simon. Automatic Test Generation on a (U)SIM Smart Card. In Josep Domingo-Ferrer, Joachim Posegga, Daniel Schreckling, editors, Smart Card Research and Advanced Applications, 7th IFIP WG 8.8/11.2 International Conference, CARDIS 2006, Tarragona, Spain, April 19-21, 2006, Proceedings. Volume 3928 of Lecture Notes in Computer Science, pages 345-358, Springer, 2006. [doi]
Abstract is missing.