Trevor J. Bihl, Kenneth W. Bauer Jr., Michael A. Temple, Benjamin W. P. Ramsey. Dimensional reduction analysis for Physical Layer device fingerprints with application to ZigBee and Z-Wave devices. In Qinqing Zhang, Jerry Brand, Tom MacDonald, Bharat T. Doshi, Bonnie L. Gorsic, editors, 34th IEEE Military Communications Conference, MILCOM 2015, Tampa, FL, USA, October 26-28, 2015. pages 360-365, IEEE, 2015. [doi]
Abstract is missing.