Vikki Binnar, Sanjeev Sharma 0002. Plant Leaf Diseases Detection Using Deep Learning Algorithms. In Rajesh Doriya, Badal Soni, Anupam Shukla, Xiao Zhi Gao, editors, Machine Learning, Image Processing, Network Security and Data Sciences - Select Proceedings of 3rd International Conference on MIND 2021, National Institute of Technology Raipur, India (Virtual Event), December 11-12, 2021. Volume 946 of Lecture Notes in Electrical Engineering, pages 217-228, Springer, 2021. [doi]
Abstract is missing.