Abeba Birhane, Vinay Uday Prabhu, John Whaley. Auditing saliency cropping algorithms. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2022, Waikoloa, HI, USA, January 3-8, 2022. pages 1515-1523, IEEE, 2022. [doi]
Abstract is missing.