Robert Birke, Ioana Giurgiu, Lydia Y. Chen, Dorothea Wiesmann, Ton Engbersen. Failure Analysis of Virtual and Physical Machines: Patterns, Causes and Characteristics. In 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2014, Atlanta, GA, USA, June 23-26, 2014. pages 1-12, IEEE, 2014. [doi]
Abstract is missing.