Empirical verification of fault models for FPGAs operating in the subcritical voltage region

Alex A. Birklykke, Peter Koch, Ramjee Prasad, Lars K. Alminde, Yannick Le Moullec. Empirical verification of fault models for FPGAs operating in the subcritical voltage region. In 2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Karlsruhe, Germany, September 9-11, 2013. pages 16-23, IEEE, 2013. [doi]

Authors

Alex A. Birklykke

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Peter Koch

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Ramjee Prasad

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Lars K. Alminde

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Yannick Le Moullec

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