N. B. Bish, Peter A. Howson, Robert J. Howlett. Condition diagnostics of a physical breakdown mechanism in high voltage dielectrics utilising AI evaluation techniques. In Robert J. Howlett, Lakhmi C. Jain, editors, Fourth International Conference on Knowledge-Based Intelligent Information Engineering Systems & Allied Technologies, KES 2000, Brighton, UK, 30 August - 1 September 2000, Proceedings, 2 Volumes. pages 644-650, IEEE, 2000. [doi]
Abstract is missing.