Memristor-Specific Failures: New Verification Methods and Emerging Test Problems

Baishakhi Rani Biswas, Sandeep Gupta. Memristor-Specific Failures: New Verification Methods and Emerging Test Problems. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]

Authors

Baishakhi Rani Biswas

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Sandeep Gupta

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