Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi. Specification Test Compaction for Analog Circuits and MEMS. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 164-169, IEEE Computer Society, 2005. [doi]
Abstract is missing.