Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra. Optimization of the Theory of FDD of DES for Alleviation of the State Explosion Problem and Development of CAD Tools for On-line Testing of Digital VLSI Circuits. In 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal. pages 184, IEEE Computer Society, 2004. [doi]
Abstract is missing.