Rajashree Biswas, Aurobinda Routray, Sabyasachi Sengupta, Meghabriti Pramanik, Arvind Kumar Gupta. EMR signature analysis for health monitoring and early stage fault diagnosis of IGBT. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 5043-5048, IEEE, 2017. [doi]
@inproceedings{BiswasRSPG17, title = {EMR signature analysis for health monitoring and early stage fault diagnosis of IGBT}, author = {Rajashree Biswas and Aurobinda Routray and Sabyasachi Sengupta and Meghabriti Pramanik and Arvind Kumar Gupta}, year = {2017}, doi = {10.1109/IECON.2017.8216871}, url = {https://doi.org/10.1109/IECON.2017.8216871}, researchr = {https://researchr.org/publication/BiswasRSPG17}, cites = {0}, citedby = {0}, pages = {5043-5048}, booktitle = {IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017}, publisher = {IEEE}, isbn = {978-1-5386-1127-2}, }