EMR signature analysis for health monitoring and early stage fault diagnosis of IGBT

Rajashree Biswas, Aurobinda Routray, Sabyasachi Sengupta, Meghabriti Pramanik, Arvind Kumar Gupta. EMR signature analysis for health monitoring and early stage fault diagnosis of IGBT. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 5043-5048, IEEE, 2017. [doi]

Abstract

Abstract is missing.