Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis

Sounil Biswas, Hongfei Wang, R. D. (Shawn) Blanton. Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis. ACM Trans. Design Autom. Electr. Syst., 19(2):20, 2014. [doi]

Abstract

Abstract is missing.