M. Blaho, Dionyz Pogany, E. Gornik, M. Denison, G. Groos, M. Stecher. Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. Microelectronics Reliability, 43(4):545-548, 2003. [doi]
@article{BlahoPGDGS03,
title = {Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method},
author = {M. Blaho and Dionyz Pogany and E. Gornik and M. Denison and G. Groos and M. Stecher},
year = {2003},
doi = {10.1016/S0026-2714(03)00021-0},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00021-0},
researchr = {https://researchr.org/publication/BlahoPGDGS03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {4},
pages = {545-548},
}