Design of a fast, easily testable ALU

R. D. (Shawn) Blanton, John P. Hayes. Design of a fast, easily testable ALU. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 9-16, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.