Olivia Bluder, Kathrin Plankensteiner, Michael Nelhiebel, Walther Heinz, Christian Leitner. Modeling fatigue life of power semiconductor devices with ε-N fields. In Stephen J. Buckley, John A. Miller, editors, Proceedings of the 2014 Winter Simulation Conference, Savannah, GA, USA, December 7-10, 2014. pages 2609-2616, IEEE/ACM, 2014. [doi]
Abstract is missing.