Mechanical and thermal reliability of printed organic thin-film transistor

X. Boddaert, B. Bensaid, P. Benaben, R. Gwoziecki, R. Coppard. Mechanical and thermal reliability of printed organic thin-film transistor. Microelectronics Reliability, 50(9-11):1884-1887, 2010. [doi]

Authors

X. Boddaert

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B. Bensaid

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P. Benaben

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R. Gwoziecki

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R. Coppard

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