X. Boddaert, B. Bensaid, P. Benaben, R. Gwoziecki, R. Coppard. Mechanical and thermal reliability of printed organic thin-film transistor. Microelectronics Reliability, 50(9-11):1884-1887, 2010. [doi]
@article{BoddaertBBGC10,
title = {Mechanical and thermal reliability of printed organic thin-film transistor},
author = {X. Boddaert and B. Bensaid and P. Benaben and R. Gwoziecki and R. Coppard},
year = {2010},
doi = {10.1016/j.microrel.2010.07.018},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.018},
tags = {reliability},
researchr = {https://researchr.org/publication/BoddaertBBGC10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1884-1887},
}