BIST with negligible aliasing through random cover circuits

T. Bogue, Helmut Jürgensen, Michael Gössel. BIST with negligible aliasing through random cover circuits. In Isao Shirakawa, editor, Proceedings of the 1995 Conference on Asia Pacific Design Automation, Makuhari, Massa, Chiba, Japan, August 29 - September 1, 1995. ACM, 1995. [doi]

Abstract

Abstract is missing.