Pierre Boher, Thierry Leroux, Véronique Collomb-Patton, Thibault Bignon. New generation of Fourier optics instruments for fast multispectral BRDF characterization. In Maria V. Ortiz Segovia, Philipp Urban, Francisco H. Imai, editors, Measuring, Modeling, and Reproducing Material Appearance 2015, San Francisco, California, United States, February 9-10, 2015. Volume 9398 of SPIE Proceedings, SPIE, 2015. [doi]
Abstract is missing.