A collision resistant deterministic random bit generator with fault attack detection possibilities

E. Bohl, M. Lewis, K. Damm. A collision resistant deterministic random bit generator with fault attack detection possibilities. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-2, IEEE, 2014. [doi]

Authors

E. Bohl

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M. Lewis

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K. Damm

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